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Design-Reuse19 年

SynTest Receives "Multiple-capture DFT system for scan-based integrated circuits" Patent ...

SAN JOSE, Calif., Oct 19, 2005-- SynTest Technologies, Inc., a leading supplier of Design-for-Test (DFT) tools, was granted 33 claims on Oct. 11, 2005 under United States Patent # 6,954,887 for its ...