资讯

EDN6 年

Middlebrook’s and Rosenstark’s loop gain measurements

Two popular ways of measuring the loop gain T of a negative-feedback circuit are Middlebrook’s double-injection method [1] and Rosenstark’s open-circuit/short ...
Semiconductor Engineering3 年

Short-Circuit Ruggedness In SiC MOSFETs

Trench-based silicon carbide power MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) represent a dramatic improvement in the Figure of Merit (FOM) values of power conversion switching ...